Spruck, Andreas
Dr. Andreas Spruck
- Viktoria Heimann, Andreas Spruck, André Kaup: Top10% Paper Award (IEEE 24th International Workshop on Multimedia Signal Processing) – 2022
- Andreas Spruck: Lehrevaluation - Bestenliste – 2018
2022
- Heimann V., Spruck A., Kaup A.:
Frequency-Selective Geometry Upsampling of Point Clouds
IEEE International Conference on Image Processing (ICIP) 2022 (Bordeaux, 16. October 2022 - 19. October 2022)
DOI: 10.1109/ICIP46576.2022.9897920
URL: https://arxiv.org/abs/2205.01458
BibTeX: Download
- Heimann V., Spruck A., Kaup A.:
Jointly Resampling and Reconstructing Corrupted Images for Image Classification using Frequency-Selective Mesh-to-Grid Resampling
IEEE 24th International Workshop on Multimedia Signal Processing (MMSP)
In: 2022 IEEE 24TH INTERNATIONAL WORKSHOP ON MULTIMEDIA SIGNAL PROCESSING (MMSP), NEW YORK: 2022
DOI: 10.1109/MMSP55362.2022.9949143
BibTeX: Download
- Heimann V., Spruck A., Kaup A.:
Resampling and Reconstructing Corrupted Images for Image Classification
IEEE International Workshop on Multimedia Signal Processing (Shanghai (virtually), 26. September 2022 - 28. September 2022)
URL: https://arxiv.org/abs/2210.15444
BibTeX: Download
- Maier A., Moussa D., Spruck A., Seiler J., Rieß C.:
Reliability Scoring for the Recognition of Degraded License Plates
2022 18th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS) (Madrid, 29. November 2022 - 2. December 2022)
DOI: 10.1109/AVSS56176.2022.9959390
URL: https://faui1-files.cs.fau.de/public/publications/mmsec/2022-Maier-AVSS.pdf
BibTeX: Download
- Moussa D., Maier A., Spruck A., Seiler J., Rieß C.:
Forensic License Plate Recognition with Compression-Informed Transformers
IEEE International Conference on Image Processing (Bordeaux, France, 16. October 2022 - 19. October 2022)
In: IEEE (ed.): 2022 IEEE International Conference on Image Processing (ICIP) 2022
DOI: 10.1109/ICIP46576.2022.9897178
URL: https://faui1-files.cs.fau.de/public/publications/mmsec/2022-Moussa-FLPR.pdf
BibTeX: Download
- Spruck A., Heimann V., Kaup A.:
Increasing the Accuracy of a Neural Network Using Frequency Selective Mesh-to-Grid Resampling
IEEE International Symposium on Circuits and Systems (ISCAS) (, 28. May 2022 - 1. June 2022)
DOI: 10.1109/iscas48785.2022.9937735
URL: https://arxiv.org/abs/2209.14431
BibTeX: Download
2021
- Heimann V., Spruck A., Kaup A.:
Frame Rate Up-Conversion Using Key Point Agnostic Frequency-Selective Mesh-to-Grid Resampling
IEEE International Conference on Acoustics, Speech and Signal Processing (Toronto (Virtual Conference), 6. June 2021 - 11. June 2021)
DOI: 10.1109/ICASSP39728.2021.9413684
URL: https://arxiv.org/abs/2210.10444
BibTeX: Download
- Heimann V., Spruck A., Kaup A.:
Frequency-Selective Mesh-to-Mesh Resampling for Color Upsampling of Point Clouds
IEEE 23rd International Workshop on Multimedia Signal Processing (Tampere, 6. October 2021 - 8. October 2021)
In: Proceedings of the IEEE International Workshop on Multimedia Signal Processing (MMSP) 2021
DOI: 10.1109/MMSP53017.2021.9733445
URL: https://arxiv.org/abs/2203.09224
BibTeX: Download
- Spruck A., Hawesch M., Maier A., Rieß C., Seiler J., Kaup A.:
3D Rendering Framework for Data Augmentation in Optical Character Recognition
2021 International Symposium on Signals, Circuits and Systems (ISSCS) (Iasi, Romania (virtual), 15. July 2021 - 16. July 2021)
In: ISSCS 2021 - International Symposium on Signals, Circuits and Systems 2021
DOI: 10.1109/ISSCS52333.2021.9497438
URL: https://arxiv.org/abs/2209.14970
BibTeX: Download
2020
- Genser N., Spruck A., Seiler J., Kaup A.:
Deep Learning Based Cross-Spectral Disparity Estimation For Stereo Imaging
2020 IEEE International Conference on Image Processing (ICIP) (Abu Dhabi, 25. October 2020 - 28. October 2020)
DOI: 10.1109/icip40778.2020.9191353
BibTeX: Download
- Spruck A., Seiler J., Roll M., Dudziak T., Eckstein J., Kaup A.:
Quality Assurance of Weld Seams Using Laser Triangulation Imaging and Deep Neural Networks
IEEE International Workshop on Metrology for Industry 4.0 and IoT (Rome (Virtual Conference), Italy, 3. June 2020 - 5. June 2020)
In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT 2020
DOI: 10.1109/MetroInd4.0IoT48571.2020.9138205
BibTeX: Download
2019
